Services
Hi-Rel Laboratories specializes in the analysis and testing of microelectronics and materials technology. With our unwavering commitment to precision and expertise, we offer a comprehensive range of services that harness the power of testing and advanced analytical techniques. Whether you require detailed material analysis, failure investigations, or quality control assessments, our team of skilled professionals leverages a vast array of tools and technologies to uncover the smallest details and provide accurate insights.
Destructive Physical Analysis
Failure Analysis
Materials Analysis
Counterfeit Detection
Real Time X-Ray
3D CT X-Ray / Laminography
Acoustic Microscopy (SAM)
Focused Ion Beam Sectioning (FIB)
Scanning Electron Microscopy (SEM)
Energy Dispersive Spectroscopy (EDS)
Fourier Transform Infrared (FTIR)
Optical Microscopy
Prohibitive Materials Analysis (PMA)
Particle Impact Noise Detection (PIND)
Hermeticity
(Fine and Gross Leak)
Delid/ Decap/ Laser Ablation
Visual Inspection
(Internal and External)
Bond Pull
Die Shear
Color Dot Identification
Infrared Hot Spot Detection
Cross Section
Physical Dimensioning
Energy Dispersive X-Ray Fluorecence (EDXRF)
Wafer Lot Acceptance Testing (WLAT)
SEM Qualification
Precision Metallographic Examination
Laser Induced Breakdown Spectroscopy (LIBS)
Component Types
Microelectronic components are the building blocks of modern technology, driving innovation and revolutionizing industries. At Hi-Rel Laboratories, we recognize the immense significance of these miniature wonders and offer expertise in the testing and analysis of their performance.
P.E.M.s, P.E.T.s, P.E.D.s
Transistors
Integrated Circuits
Diodes
(Glass or Metal Can)
Switches
Capacitors
Magnetics
(Inductor/ Transformer)
Relays
Thermistors
Crystals
Resistors
Fuses
Connectors
Hybrids
Heaters
