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Hi-Rel Laboratories Logo

Leaders in microelectronic testing and analysis since 1972

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Upcoming Lab Closure

Hi-Rel will be closed December 23rd 2024 through January 1st 2025. Thank you all for a great year!

Counterfeit Detection
(CD)

For over 50 years, our physical analysis of semiconductors has been a trusted resource for companies around the world. We now offer a new division specializing in counterfeit detection. Our team has the experience and expertise to ensure your components are up to industry standards and free of counterfeit materials.

Destructive Physical Analysis (DPA)

Hi-Rel has been the industry leader in DPA testing since 1973, supporting the defense and aerospace industries. We are experts in evaluating all component types.  Regular participants on industry working groups that define test requirements for microelectronic components.

Materials Analysis (MA)

Hi-Rel specializes in evaluating microelectronic components, materials and associated processes.  Using proven analytical techniques, both destructive and non-destructive, we can help with your material-related needs

Upgrade Services (NDT)

Hi-Rel offers non-electrical test upgrade services including Particle Impact Noise Detection (PIND), digital real-time radiography, hermeticity testing, Scanning Acoustic Microscopy (SAM) and color dot marking.  All operations are performed in our ESD protected work area with bonded device storage

Failure  Analysis  (FA)

Performing failure analysis on electronic devices and assemblies since 1972, Hi-Rel has vast experience in assisting customers with their root cause investigations, from passive components to custom hybrids.

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